ISSN 0564-3783  



Main page
Contacts
Preview papers  
Themes
Contents  
Themes
Subscription
Information to authors
Editorial board
Mobile version


In Russian

Export citations
UNIMARC
BibTeX
RIS





Critical level of radiation damage of root apical meristem and mechanisms for its recovery in Pisum sativum L.

Kravets E.A., Mykheyev A.N., Ovsyannikova L.G., Grodzynsky D.M.

 


[Free Full Text (pdf)]Article Free Full Text (pdf)  

The dose dependencies of growth and cytogenetical values have been built to determine the critical level of root apical meristem damage induced by cute irradiation in the range from 2 to 20 Gr. We have analyzed the frequencies of aberrant anaphases and the aberration distribution per cell, on the one hand, and the growth of biomass, the survival and regeneration of the root meristem, on the other hand. The critical level of damage to the stem apical meristem and root of seedlings was defined as 44–48 % of aberrant anaphase. Exceeding of this level leads to the launch of suicidal program through induction of multiaberrant damages and interphase cell death. It appears that competition of clones of non-aberrant cells, the cells bearing 1 and 2 damages and multiaberrant cells plays the primary role in the mechanisms of recovery. The regeneration provides full or partial restoration of the main root apical meristem. However these local processes are insufficient to restore morphogenesis and survival of seedlings in excess of the critical level damage.

Tsitologiya i Genetika 2011, vol. 45, no. 1, pp. 24-34

E-mail: elkrav online.ua

Kravets E.A., Mykheyev A.N., Ovsyannikova L.G., Grodzynsky D.M. Critical level of radiation damage of root apical meristem and mechanisms for its recovery in Pisum sativum L., Tsitol Genet., 2011, vol. 45, no. 1, pp. 24-34.

In "Cytology and Genetics":
E. A. Kravets, A. N. Mikheev, L. G. Ovsyannikova, D. M. Grodzinsky Critical level of radiation damage of root apical meristem and mechanisms for its recovery in Pisum sativum L., Cytol Genet., 2011, vol. 45, no. 1, pp. 18-26
DOI: 10.3103/S0095452711010051


Copyright© ICBGE 2002-2018 Coded & Designed by Volodymyr Duplij Modified 20.10.18